Download e-book for iPad: Advanced Materials and Technologies for Micro Nano-Devices, by Evgeni Gusev, Eric Garfunkel, Arthur Dideikin

By Evgeni Gusev, Eric Garfunkel, Arthur Dideikin

ISBN-10: 9048138051

ISBN-13: 9789048138050

The most objective of this e-book is to study fresh development and present prestige of MEMS/NEMS applied sciences and units. a number of very important parts are mentioned: background of study within the box, machine physics, examples of sucessful functions, sensors, fabrics and processing features. The authors who've contributed to the ebook characterize a various team of major scientists from educational, business and governmental labs world wide who deliver a huge array of backgrounds reminiscent of machine physics, technologists, electric and mechanical engineering, floor chemistry and fabrics science). The contributions to this publication are obtainable to either specialist scientists and engineers who have to stay alongside of cutting edge learn, and newbies to the sector who desire to examine extra concerning the fascinating easy and utilized examine concerns correct to micromechanical units and applied sciences.

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Additional info for Advanced Materials and Technologies for Micro Nano-Devices, Sensors and Actuators

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PFM was used to read out the bits images in Figure 1 which measures a 4 × 4 μm scan area individually. 2. READ OPERATION Nanochip developed a scanning probe charge reading technique (SPCRT) to provide a high speed bit reading method compatible with MEMS and CMOS device integration. In SPCRT [11], a conductive probe tip connected with a charge-amplifier circuitry is used to detect a polarization bit signal like the bit signal trace demonstrated in Figure 2a. 1–1 cm/s) and detects the bit signal with the data rate in a range of a 1 k–1 Mbps per tip.

Figure 8. Top view and cross-section of X-Y micro-mover. 1 – moveable plate; 2 – anchors; 3 – frame; 4 – coils; 5 – position sensors; 6 – mass reduction profile; 7 – main suspension beams carrying wires providing connection to bottom electrode of memory stack; 8 – routing suspension beams carrying wires providing connections to coils and position sensors; 9 – joints; 10 – dummy structures; 11 – memory stack. A MEMS-BASED ULTRA-HIGH DATA DENSITY MEMORY DEVICE 49 coils and position sensors. Although the micro-mover has mass reduction profile 6, the moveable plate is extremely flat because of its thickness.

Volume manufacturing of probe storage devices requires customized solutions for functional testing of both cap-mover and cantilever wafers before bonding. Figure 13. Natural resonance frequency measured by mechanical–optical method (top two screens) and by electrical actuation of the same micro-mover (two bottom screens). A MEMS-BASED ULTRA-HIGH DATA DENSITY MEMORY DEVICE 55 Electrical testing of micro-movers is not possible at this stage because the bond pads located between the cap and mover are not accessible.

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Advanced Materials and Technologies for Micro Nano-Devices, Sensors and Actuators by Evgeni Gusev, Eric Garfunkel, Arthur Dideikin

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